Circular BIST testing the digital logic within a high speed Serdes
نویسندگان
چکیده
High Speed Serializer Deserializers (serdes) are traditionally tested using functional BIST. This paper presents an improved BIST for testing the digital part of a serdes using circular BIST.
منابع مشابه
Serializer/Deserializer Component Design and Test
Serializer/Deserializers (SerDes) commonly used in telecommunication networks are now becoming widespread in computer and embedded systems to meet higher data bandwidth demand and support higher peripheral device performance requirements. These input/output (IOs) peripherals are design to provide reliable high speed data transfer capabilities to computers and embedded devices. This thesis provi...
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